Completely revamped 3D visualisers

Completely revamped 3D visualisers 

Additionally to a series of bug fixes in the 3D data loader, the 3D visualiser and the 3D overlay tools were redesigned to allow more customisation (they are also now applicable to both the original data AND MVA results!).

The Z-correction tool has also been improved. The user can now pre-process the data and select whether to base the correction on a substrate or topographical feature

New Z-correction tool
3D viewer
3D overlay

18 example datasets!

You can now find on the top menu 18 different example datasets of various different structures. This includes 4 examples of analytical techniques other than SIMS. This list of examples is as follows:

Imaging

  • Particles: metal particles on an organic substrate.
  • Blend: a cross-section of a polymer blend deposited onto a metal substrate (see publication).
  • Adhesive 1 & 2: surface of an industrial adhesive with circular features.
  • Droplet: surface of a topographical metal droplet.

Spectra

  • Dicarboxylic acids: a set of spectra from standard dicarboxylic acids (see publication).
  • Wood: spectra from wood samples together with standards for lignin and cellulose (see publication).
  • Polypropylene: spectra of polypropylene-based composites with varying formulations.

Depth Profiling

  • Metal multilayer: a dual-beam (Bi+ Cs+) depth profile of various different metallic layers.
  • Organic/metal interface: a dual beam (Bi+ Ar_n+) depth profile of a hybrid interface.

3D Data

  • Encapsulated polymer: a polymer “sphere” encapsulated by another polymer matrix.
  • Copper grid: a copper grid on an aluminium substrate.
  • Organic/metal interface: the 3D version of the depth profiling example.

Other Techniques

  • Raman map: a Raman microscopy map of a droplet casted on SiO2.
  • XPS profile: an XPS – C1s depth profile.
  • PIXE map: a microbeam PIXE map of a cross-section.
  • PIXE spectra: a set of various slightly different broad-beam PIXE spectra.